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Testing of a single-polarity piezoresistive three-dimensional stress-sensing chip

Author
GHARIB, H. H1 ; MOUSSA, W. A1
[1] Department of Mechanical Engineering, University of Alberta, Alberta, Canada
Source

Journal of micromechanics and microengineering (Print). 2013, Vol 23, Num 9 ; 095036.1-095036.13 ; ref : 31 ref

ISSN
0960-1317
Scientific domain
Electronics; Mechanical engineering
Publisher
Institute of Physics, Bristol
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Capteur déformation Champ déformation Charge appliquée Contrainte compression Dispositif piézorésistif Distribution contrainte Essai flexion Microusinage Méthode numérique Méthode élément fini Système sur puce Tenseur contrainte
Keyword (en)
Strain sensors Strain distribution Applied load Compressive stress Piezoresistive devices Stress distribution Bending test Micromachining Numerical method Finite element method System on a chip Stress tensor
Keyword (es)
Campo deformación Carga aplicada Tensión compresión Ensayo flexion Método numérico Tensor tensión
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G07 General equipment and techniques / 001B00G07D Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing

Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40F Solid mechanics / 001B40F30 Structural and continuum mechanics / 001B40F30R Measurement and testing methods

Discipline
Metrology Physics : solid mechanics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27749809

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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