The effect of oxygen ion beam bombardment on the properties of tin indium oxide/polyethylene terephthalate complex
- Author
- LI LI1 ; HONGLIN LIU1 ; LIN ZOU1 ; WANYU DING1 2 ; DONGYING JU3 ; WEIPING CHAI1
[1] School of Materials Science and Engineering, Dalian Jiaotong University, Dalian 116028, China
[2] Key Laboratory of Materials Modification by Laser, Ion and Electron Beams (Dalian University of Technology), Ministry of Education, Dalian 116028, China
[3] Department of Material Science and Engineering, Saitama Institute of Technology, Fukaya 369-0293, Japan - Source
Thin solid films. 2013, Vol 545, pp 365-370, 6 p ; ref : 28 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- O ion bombardment Photoelectron spectroscopy Polyethylene terephthalate Tin indium oxide
- Keyword (fr)
- Adhérence Couche mince Croissance film Effet rayonnement Ethylène polymère Ethylène téréphtalate polymère Faisceau ion Flexion Interface Microscopie électronique balayage Oxyde d'indium Oxyde d'étain Propriété mécanique Puce électronique Résistivité électrique Spectre photoélectron RX Spectrométrie photoélectron Tribologie Téréphtalate 4335N 6180 6855J 6860B
- Keyword (en)
- Adhesion Thin films Film growth Radiation effects Polyethylenes Ethylene terephthalate polymer Ion beams Bending Interfaces Scanning electron microscopy Indium oxide Tin oxide Mechanical properties Chip Electric resistivity X-ray photoelectron spectra Photoelectron spectroscopy Tribology Terephthalates
- Keyword (es)
- Etileno tereftalato polímero Indio óxido Estaño óxido Pulga electrónica
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A80 Physical radiation effects, radiation damage
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 27823360
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2013.08.071 
https://dx.doi.org/10.1016/j.tsf.2013.08.071
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