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The Wagner plot and the Auger parameter as tools to separate initial- and final-state contributions in X-ray photoemission spectroscopy

Author
MORETTI, Giuliano1
[1] Dipartimento di Chimica, Università di Roma La Sapienza, Piazzale A. Moro, 5, 00185, Roma, Italy
Source

Surface science. 2013, Vol 618, pp 3-11, 9 p ; ref : 118 ref

CODEN
SUSCAS
ISSN
0039-6028
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics; Polymers, paint and wood industries
Publisher
Elsevier, Kidlington
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Auger parameter Auger spectroscopy Wagner plot XPS
Keyword (fr)
Effet Auger Spectre photoélectron RX Spectrométrie Auger
Keyword (en)
Auger effect X-ray photoelectron spectra AES
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology

Discipline
Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
27868950

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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