A consistent method for quantitative XPS peak analysis of thin oxide films on clean polycrystalline iron surfaces
- Author
- LIN, T.-C1 ; SESHADRI, G1 ; KELBER, J. A1
[1] Department of Chemistry, University of North Texas, P.O. Box 5068, Denton, TX 76203-0068, United States - Source
Applied surface science. 1997, Vol 119, Num 1-2, pp 83-92 ; ref : 41 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse quantitative Couche mince Etude expérimentale Fer oxyde Rayon X Spectrométrie photoélectron Stoechiométrie Fe O Composé minéral Métal transition composé
- Keyword (en)
- Quantitative chemical analysis Thin films Experimental study Iron oxides X radiation Photoelectron spectroscopy Stoichiometry Inorganic compounds Transition element compounds
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55L Defects and impurities: doping, implantation, distribution, concentration, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I60 Photoemission and photoelectron spectra / 001B70I60D Adsorbed layers and thin films
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2800490
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/S0169-4332(97)00167-0 
https://dx.doi.org/10.1016/S0169-4332(97)00167-0
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