SQUID based remanence measurements for immunoassays
- Autor
- KÖTITZ, R1 ; MATZ, H1 ; TRAHMS, L1 ; KOCH, H1 ; WEITSCHIES, W2 ; RHEINLÄNDER, T2 ; SEMMLER, W2 ; BUNTE, T3
[1] Physikalisch Technische Bundesanstalt, Abbestr. 10-12, 10587 Berlin, Germany
[2] Institut für Diagnostikforschung GmbH Berlin, Germany
[3] Schering AG, Berlin, Germany - Titulo de la conferencia
- Electronics
- Nombre de la conferencia
- 1996 Applied Superconductivity Conference. Part III (Pittsburgh, PA 1996-08-25)
- Autor ( monografía)
- Applied Superconductivity Conference Inc, United States (Funder/Sponsor)
- Fuente
IEEE transactions on applied superconductivity. 1997, Vol 7, Num 2, pp 3678-3681 ; 3 ; ref : 5 ref
- ISSN
- 1051-8223
- Campo Científico
- Electronics; Electrical engineering
- Editor
- Institute of Electrical and Electronics Engineers, New York, NY
- País de la publicación
- United States
- Tipo de documento
- Conference Paper
- Idioma
- English
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices
- Pascal
- 002 Biological and medical sciences / 002B Medical sciences / 002B24 Investigative techniques, diagnostic techniques (general aspects) / 002B24O Pathology. Cytology. Biochemistry. Spectrometry. Miscellaneous investigative techniques / 002B24O10 Hematology
- Disciplina
- Electronics Scanning and diagnostic techniques
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 2822469
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Acceso al documento
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DOI
10.1109/77.622216 
https://dx.doi.org/10.1109/77.622216
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