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Morphology and in situ deformation of polyamide films investigated with scanning force microscopy

Author
DRECHSLER, D1 ; KARBACH, A2 ; FUCHS, H1
[1] Westfälische Wilhelms-Universität Münster, Physikalisches Institut, 48149 Münster, Germany
[2] Bayer AG Leverkusen, Zentrale Forschung, Polymer Physik, 47812 Krefeld, Germany
Conference title
SXM 2 Workshop, Vienna, Austria, 16-18 September 1996
Conference name
SXM 2 Workshop (2 ; Vienna 1996-09-16) = SXM 2: Workshop on Development and Industrial Application of Scanning Probe Microscopy (2 ; Vienna 1996-09-16)
Author (monograph)
FRIEDBACHER, Gernot (Editor)1
[1] Vienna University of Technology, Austria
Source

Surface and interface analysis. 1997, Vol 25, Num 7-8, pp 537-542 ; ref : 17 ref

CODEN
SIANDQ
ISSN
0142-2421
Scientific domain
General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
Publisher
Wiley, Chichester
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Keyword (fr)
Amide polymère Couche épaisse Etude expérimentale In situ Microscopie force Morphologie cristalline Méthode mesure Propriété traction Relation structure propriété Sphérolite Propriété mécanique
Keyword (en)
Nylon Thick film Experimental study In situ Force microscopy Crystal morphology Measurement method Tensile property Property structure relationship Spherulites Mechanical properties
Keyword (es)
Amida polímero Capa espesa Estudio experimental In situ Microscopía fuerza Morfología cristalina Método medida Propiedad tracción Relación estructura propiedad Esferolito Propiedad mecánica
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D09 Physicochemistry of polymers / 001D09D Organic polymers / 001D09D04 Properties and characterization / 001D09D04K Structure, morphology and analysis

Discipline
Physical chemistry of polymers
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2827657

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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