Interplay between {1 0 1 2} deformation twins and basal stacking faults enriched with Zn/Y in Mg97Zn1Y2 alloy
- Autor
- SHAO, X. H1 ; YANG, Z. Q1 ; MA, X. L1
[1] Shenyang National Laboratory for Materials Science, Institute of Metal Research, Chinese Academy of Sciences, Shenyang 110016, China - Fuente
Philosophical magazine letters. 2014, Vol 94, Num 1-3, pp 150-156, 7 p ; ref : 30 ref
- CODEN
- PMLEEG
- ISSN
- 0950-0839
- Campo Científico
- Crystallography; Condensed state physics
- Editor
- Taylor & Francis, Abingdon
- País de la publicación
- United Kingdom
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave (fr)
- Distorsion Défaut cristallin Défaut empilement Joint macle Macle mécanique Microscopie électronique transmission Mode empilement Plan accolement Résolution image Structure cristalline 6166 6172M 6172N
- Palabra clave (in)
- Distortion Crystal defects Stacking faults Twin boundaries Mechanical twin Transmission electron microscopy Stacking sequence Habit plane Image resolution Crystal structure
- Palabra clave (es)
- Macla mecánica Modo apilamiento
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A66 Structure of specific crystalline solids
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72M Grain and twin boundaries
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72N Stacking faults and other planar or extended defects
- Disciplina
- Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 28339677
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/09500839.2014.885123 
https://dx.doi.org/10.1080/09500839.2014.885123
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