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Complex general Fourier variational method applied to the analysis of semiconductor lasers

Author
NOUREDDINE, M1 ; BENSON, T. M1 ; SMARTT, C. J1 ; KENDALL, P. C2
[1] Department of Electrical and Electronic Engineering, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom
[2] Department of Electronic and Electrical Engineering, University of Sheffield, PO Box 600, Sheffield S1 4UD, United Kingdom
Source

IEE proceedings. Optoelectronics. 1997, Vol 144, Num 4, pp 241-245 ; ref : 23 ref

ISSN
1350-2433
Scientific domain
Electronics; Optics
Publisher
Institution of Electrical Engineers, Stevenage
Publication country
United Kingdom
Document type
Article
Language
English
Keyword (fr)
Analyse Fourier Indice réfraction Laser semiconducteur Multicouche Méthode analyse Optoélectronique Principe variationnel Propagation onde
Keyword (en)
Fourier analysis Refraction index Semiconductor laser Multiple layer Analysis method Optoelectronics Variational principle Wave propagation
Keyword (es)
Análisis Fourier Indice refracción Laser semiconductor Capa múltiple Método análisis Optoelectrónica Principio variacional Propagación onda
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B55 Lasers / 001B40B55P Semiconductor lasers; laser diodes

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G01 Theoretical study. Circuits analysis and design

Discipline
Electronics Physics : optics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2835099

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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