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Comparative characterization of Cu―Ni substrates for coated conductors

Author
TIAN, H1 ; SUO, H. L1 ; WULFF, A. C2 ; GRIVEL, J.-C2 ; MISHIN, O. V3 ; JUUL JENSEN, D3
[1] College of Materials Science and Engineering, Beijing University of Technology, 100124 Beijing, China
[2] Department of Energy Conversion and Storage, Technical University of Denmark, 4000 Roskilde, Denmark
[3] Danish-Chinese Center for Nanometals, Section for Materials Science and Advanced Characterization, Department of Wind Energy, Technical University of Denmark, Risø Campus, 4000 Roskilde, Denmark
Source

Journal of alloys and compounds. 2014, Vol 601, pp 9-13, 5 p ; ref : 25 ref

ISSN
0925-8388
Scientific domain
Inorganic chemistry; Crystallography; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Kidlington
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Cube texture Cu―Ni alloys EBSD RABiTS
Keyword (fr)
Bande supraconductrice Cuivre alliage Diffraction électron rétrodiffusé Durcissement Dureté Désorientation grain Haute température Joint grand angle Laminage Microstructure Nickel alliage Recuit Texture Conducteur déposé
Keyword (en)
Superconducting tapes Copper alloys EBSD Hardening Hardness High angle grain boundary High temperature High angle boundary Rolling Microstructure Nickel alloys Annealing Texture Coated conductor
Keyword (es)
Límite intergranular gran ángulo Alta temperatura Junta gran angulo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A40 Treatment of materials and its effects on microstructure and properties / 001B80A40G Other heat and thermomechanical treatments

Discipline
Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
28423822

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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