Three ranges of the angular dependence of critical current of BaZrO3 doped YBa2Cu3O7 ― δ thin films grown at different temperatures
- Autor
- MALMIVIRTA, M1 ; YAO, L. D2 ; HUHTINEN, H1 ; PALONEN, H1 3 ; VAN DIJKEN, S2 ; PATURI, P1
[1] Wihuri Physical Laboratory, Department of Physics and Astronomy, University of Turku, 20014 Turku, Finland
[2] NanoSpin, Department of Applied Physics, Aalto University, School of Science, P.O. Box 15100, 00076 Aalto, Finland
[3] The National Doctoral Programme in Nanoscience (NGS-NANO), Turku, Finland - Fuente
Thin solid films. 2014, Vol 562, pp 554-560, 7 p ; ref : 36 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Campo Científico
- Crystallography; Metallurgy, welding; Condensed state physics
- Editor
- Elsevier, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave de autor
- Barium zirconate Columnar defects Flux pinning High-temperature superconductor Thin films Transmission electron microscopy Yttrium barium copper oxide
- Palabra clave (fr)
- Ancrage Couche mince Densité courant critique Diffraction RX Dopage Défaut empilement Dépendance température Dépôt laser pulsé Mesure magnétique Microscopie électronique transmission Mécanisme croissance Oxyde d'yttrium Oxyde de baryum Oxyde de cuivre Supraconducteur haute température 6172N 6855A 6855L 8115F BaZrO3 YBa2Cu3O7-δ
- Palabra clave (in)
- Pinning Thin films Critical current density XRD Doping Stacking faults Temperature dependence Pulsed laser deposition Magnetic measurement Transmission electron microscopy Growth mechanism Yttrium oxide Barium oxide Copper oxide High-Tc superconductors
- Palabra clave (es)
- Densidad corriente crítica Doping Medida magnética Mecanismo crecimiento Ytrio óxido Bario óxido Cobre óxido
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72N Stacking faults and other planar or extended defects
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55L Defects and impurities: doping, implantation, distribution, concentration, etc
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15A Theory and models of film growth
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15F Laser deposition
- Disciplina
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 28538675
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2014.04.093 
https://dx.doi.org/10.1016/j.tsf.2014.04.093
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