Pascal and Francis Bibliographic Databases

Help

Export

Selection :

Permanent link
http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=28602227

A method based on optical and atomic force microscopes for instant imaging of non-homogeneous electro-mechanical processes and direct estimation of dij coefficients in piezoelectric materials at the local level

Author
STAMOPOULOS, D1 ; ZHANG, S. J2
[1] Institute of Advanced Materials, Physicochemical Processes, Nanotechnology and Microsystems, National Center for Scientific Research 'Demokritos', 15310 Agia Paraskevi, Greece
[2] Materials Research Institute, The Pennsylvania State University, University Park, PA 16801, United States
Source

Journal of alloys and compounds. 2014, Vol 612, pp 34-41, 8 p ; ref : 37 ref

ISSN
0925-8388
Scientific domain
Inorganic chemistry; Crystallography; Metallurgy, welding; Condensed state physics
Publisher
Elsevier, Kidlington
Publication country
United Kingdom
Document type
Article
Language
English
Author keyword
Atomic force microscope Non-homogeneous electro-mechanical processes Optical microscope Piezoelectric coefficients Strain-electric field curve
Keyword (fr)
Champ déformation Effet champ électrique Matériau ferroélectrique Matériau piézoélectrique Microscopie force atomique Microscopie optique Monocristal Piézoélectricité Propriété thermomécanique Magnoniobate de plomb
Keyword (en)
Strain distribution Electric field effects Ferroelectric materials Piezoelectric materials Atomic force microscopy Optical microscopy Monocrystals Piezoelectricity Thermomechanical properties Lead magnesium niobates
Keyword (es)
Campo deformación Propriedad termomecánica Niobato de Magnesio y plomo
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70G Dielectrics, piezoelectrics, and ferroelectrics and their properties / 001B70G65 Piezoelectricity and electromechanical effects

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
28602227

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

Access to the document

Searching the Web