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The Effects of Ti Addition and High Cu/Sn Ratio on Tube Type (Nb, Ta)3Sn Strands, and a New Type of Strand Designed to Reduce Unreacted Nb Ratio

Author
XINGCHEN XU1 ; COLLINGS, Edward1 ; SUMPTION, Michael1 ; KOVACS, Chris1 ; XUAN PENG2
[1] Ohio State University, Columbus, OH 43210, United States
[2] Hyper Tech Research Inc., Columbus, OH 43228, United States
Conference title
THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013
Conference name
MT-23 International Conference on Magnet Technology (23 ; Boston, MA 2013-07-14)
Source

IEEE transactions on applied superconductivity. 2014, Vol 24, Num 3 ; 6000904.1-6000904.4 ; ref : 14 ref

ISSN
1051-8223
Scientific domain
Electronics; Electrical engineering
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Author keyword
Irreversibility field Nb3Sn layer Jc tube type
Keyword (fr)
Addition tantale Addition titane Alliage base niobium Cuivre Dopage Etain alliage Fil Ligne irréversibilité Matériau dopé Matériau granulaire Processus irréversible Stoechiométrie Structure grain fin Titane alliage Toron 8525 Nb Sn
Keyword (en)
Tantalum addition Titanium addition Niobium base alloy Copper Doping Tin alloy Thread Irreversibility line Doped materials Granular material Irreversible process Stoichiometry Fine grain structure Titanium alloy Strand
Keyword (es)
Adición tántalio Adición titanio Aleación base niobio Cobre Doping Estaño aleación Hilo Material granular Proceso irreversible Estequiométría Estructura grano fino Titanio aleación Bocel
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F11 Superconducting devices

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
28688526

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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