Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests
- Author
- FETISOV, Sergey S1 ; POLYAKOVA, Nelly V1 ; KAVERIN, Denis S1 ; POTANINA, Liudmila V1 ; SHUTOV, Kirill A1 ; SVALOV, Grigory G1 ; TRONZA, Vladimir I2 ; VYSOTSKY, Vitaly S1
[1] Russian Scientific R&D Cable Institute (VNIIKP), 111024 Moscow, Russian Federation
[2] RF Domestic Agency, ITER-Center, 123098 Moscow, Russian Federation - Conference title
- THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013
- Conference name
- MT-23 International Conference on Magnet Technology (23 ; Boston, MA 2013-07-14)
- Source
IEEE transactions on applied superconductivity. 2014, Vol 24, Num 3 ; 8800305.1-8800305.5 ; ref : 11 ref
- ISSN
- 1051-8223
- Scientific domain
- Electronics; Electrical engineering
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Conference Paper
- Language
- Russian
- Author keyword
- ITER Nb3Sn measurement technique residual resistance ratio (RRR) parameter strands
- Keyword (fr)
- Aimant Compactage Conducteur électrique Cycle thermique Câble sous tube Electromagnétisme Impureté résiduelle Installation essai Méthode mesure Nettoyage Procédé fabrication Réacteur fusion nucléaire Supraconducteur Tokamak ITER Toron
- Keyword (en)
- Magnet Compaction Electrical conductor Thermal cycle Pipe cable Electromagnetism Residual impurity Test facility Measurement method Cleaning Manufacturing process Nuclear fusion reactor Superconducting materials ITER tokamak Strand
- Keyword (es)
- Imán Compactación Conductor eléctrico Ciclo térmico Cable bajo tubo Electromagnetismo Impureza residual Instalación ensayo Método medida Limpieza Procedimiento fabricación Reactor fusión nuclear Supraconductor Bocel
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G01 Electromagnets
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05G Various equipment and components / 001D05G04 Electric connection. Cables. Wiring
- Discipline
- Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 28688572
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
Access to the document
Install on your browser
DOI
10.1109/TASC.2013.2290283 
https://dx.doi.org/10.1109/TASC.2013.2290283
"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2014\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:19:\"8800305.1-8800305.5\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"FETISOV\";s:10:\"\u0000*\u0000aufirst\";s:8:\"Sergey S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:18:\"POLYAKOVA, Nelly V\";i:1;s:16:\"KAVERIN, Denis S\";i:2;s:20:\"POTANINA, Liudmila V\";i:3;s:16:\"SHUTOV, Kirill A\";i:4;s:17:\"SVALOV, Grigory G\";i:5;s:18:\"TRONZA, Vladimir I\";i:6;s:18:\"VYSOTSKY, Vitaly S\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:96:\"THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013\";s:8:\"\u0000*\u0000title\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Panist access
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2014\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:19:\"8800305.1-8800305.5\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"FETISOV\";s:10:\"\u0000*\u0000aufirst\";s:8:\"Sergey S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:18:\"POLYAKOVA, Nelly V\";i:1;s:16:\"KAVERIN, Denis S\";i:2;s:20:\"POTANINA, Liudmila V\";i:3;s:16:\"SHUTOV, Kirill A\";i:4;s:17:\"SVALOV, Grigory G\";i:5;s:18:\"TRONZA, Vladimir I\";i:6;s:18:\"VYSOTSKY, Vitaly S\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:96:\"THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013\";s:8:\"\u0000*\u0000title\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Istex access
"O:16:\"UnpaywallOpenUrl\":35:{s:8:\"\u0000*\u0000email\";s:27:\"assistance-portail@inist.fr\";s:6:\"\u0000*\u0000fmt\";N;s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";N;s:7:\"\u0000*\u0000pmid\";N;s:9:\"\u0000*\u0000atitle\";N;s:9:\"\u0000*\u0000jtitle\";N;s:9:\"\u0000*\u0000stitle\";N;s:7:\"\u0000*\u0000date\";N;s:9:\"\u0000*\u0000volume\";N;s:8:\"\u0000*\u0000issue\";N;s:8:\"\u0000*\u0000spage\";N;s:8:\"\u0000*\u0000epage\";N;s:8:\"\u0000*\u0000pages\";N;s:7:\"\u0000*\u0000issn\";N;s:8:\"\u0000*\u0000eissn\";N;s:9:\"\u0000*\u0000aulast\";N;s:10:\"\u0000*\u0000aufirst\";N;s:9:\"\u0000*\u0000auinit\";N;s:10:\"\u0000*\u0000auinitm\";N;s:5:\"\u0000*\u0000au\";N;s:9:\"\u0000*\u0000aucorp\";N;s:7:\"\u0000*\u0000isbn\";N;s:8:\"\u0000*\u0000coden\";N;s:8:\"\u0000*\u0000genre\";N;s:7:\"\u0000*\u0000part\";N;s:9:\"\u0000*\u0000btitle\";N;s:8:\"\u0000*\u0000title\";N;s:8:\"\u0000*\u0000place\";N;s:6:\"\u0000*\u0000pub\";N;s:10:\"\u0000*\u0000edition\";N;s:9:\"\u0000*\u0000tpages\";N;s:9:\"\u0000*\u0000series\";N;s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";N;}"
Unpaywall access
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2014\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:19:\"8800305.1-8800305.5\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"FETISOV\";s:10:\"\u0000*\u0000aufirst\";s:8:\"Sergey S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:18:\"POLYAKOVA, Nelly V\";i:1;s:16:\"KAVERIN, Denis S\";i:2;s:20:\"POTANINA, Liudmila V\";i:3;s:16:\"SHUTOV, Kirill A\";i:4;s:17:\"SVALOV, Grigory G\";i:5;s:18:\"TRONZA, Vladimir I\";i:6;s:18:\"VYSOTSKY, Vitaly S\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:96:\"THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013\";s:8:\"\u0000*\u0000title\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Europe PubMed Central access
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2014\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:19:\"8800305.1-8800305.5\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"FETISOV\";s:10:\"\u0000*\u0000aufirst\";s:8:\"Sergey S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:18:\"POLYAKOVA, Nelly V\";i:1;s:16:\"KAVERIN, Denis S\";i:2;s:20:\"POTANINA, Liudmila V\";i:3;s:16:\"SHUTOV, Kirill A\";i:4;s:17:\"SVALOV, Grigory G\";i:5;s:18:\"TRONZA, Vladimir I\";i:6;s:18:\"VYSOTSKY, Vitaly S\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:96:\"THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013\";s:8:\"\u0000*\u0000title\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Base Search access
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:10:\"proceeding\";s:6:\"\u0000*\u0000doi\";s:25:\"10.1109\/TASC.2013.2290283\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:9:\"\u0000*\u0000jtitle\";s:46:\"IEEE transactions on applied superconductivity\";s:9:\"\u0000*\u0000stitle\";s:27:\"IEEE trans. appl. supercond\";s:7:\"\u0000*\u0000date\";s:4:\"2014\";s:9:\"\u0000*\u0000volume\";s:2:\"24\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:0:\"\";s:8:\"\u0000*\u0000epage\";s:0:\"\";s:8:\"\u0000*\u0000pages\";s:19:\"8800305.1-8800305.5\";s:7:\"\u0000*\u0000issn\";s:9:\"1051-8223\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"FETISOV\";s:10:\"\u0000*\u0000aufirst\";s:8:\"Sergey S\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:7:{i:0;s:18:\"POLYAKOVA, Nelly V\";i:1;s:16:\"KAVERIN, Denis S\";i:2;s:20:\"POTANINA, Liudmila V\";i:3;s:16:\"SHUTOV, Kirill A\";i:4;s:17:\"SVALOV, Grigory G\";i:5;s:18:\"TRONZA, Vladimir I\";i:6;s:18:\"VYSOTSKY, Vitaly S\";}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:0:\"\";s:8:\"\u0000*\u0000genre\";s:10:\"proceeding\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:96:\"THE TWENTY-THIRD INTERNATIONAL CONFERENCE ON MAGNET TECHNOLOGY, Boston, MA, USA, July 14-19 2013\";s:8:\"\u0000*\u0000title\";s:102:\"Residual Resistance Ratio in Nb3Sn Strands During ITER TF Conductor Manufacture and After SULTAN Tests\";s:8:\"\u0000*\u0000place\";s:12:\"New York, NY\";s:6:\"\u0000*\u0000pub\";s:49:\"Institute of Electrical and Electronics Engineers\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
arXiv access
