Reliability and Validity of Japanese Versions of the Flourishing Scale and the Scale of Positive and Negative Experience
- Author
- SUMI, Katsunori1
[1] Nagare College, Nagoya Institute of Technology, Gokiso-cho, Showa-ku, Nagoya 466-8555, Japan - Source
Social indicators research. 2014, Vol 118, Num 2, pp 601-615, 15 p ; ref : 2 p.3/4
- Publisher
- Springer, Dordrecht
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Author keyword
- Flourishing Measure Negative affect Positive affect Wen-being
- Keyword (fr)
- Affectivité Bien-être Echelle d'évaluation Etudiant Fiabilité Fidélité Psychométrie Subjectivité Université Validité Flourishing Scale Diener et al Scale of Positive and Negative Experience Diener et al Japon
- Keyword (en)
- Affectivity Well-being Rating Scale Student Reliability Faithfulness Psychometrics Subjectivity University Validity Japan
- Classification
- Francis
- 521 Sociology / 521-1 History, theory and methodology / 521-8 Methodology
- Discipline
- Sociology
- Origin
- Inist-CNRS
- Database
- FRANCIS
- INIST identifier
- 28690913
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1007/s11205-013-0432-6 
https://dx.doi.org/10.1007/s11205-013-0432-6
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