Electromigration in Sn-Ag solder thin films under high current density
- Autor
- ZHU, X1 ; KOTADIA, H2 ; XU, S3 ; LU, H1 ; MANNAN, S. H2 ; BAILEY, C1 ; CHAN, Y. C3
[1] School of Computing and Mathematical Sciences, University of Greenwich, 30 Park Row, London SE10 9LS, United Kingdom
[2] Physics Department, School of Natural & Mathematical Sciences, King's College London, Strand, London WC2R 2LS, United Kingdom
[3] Department of Electronic Engineering, City University of Hong Kong, 83 Tat Chee Avenue, Kow-loon Tong, Hong-Kong - Fuente
Thin solid films. 2014, Vol 565, pp 193-201, 9 p ; ref : 19 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Campo Científico
- Crystallography; Metallurgy, welding; Condensed state physics
- Editor
- Elsevier, Amsterdam
- País de la publicación
- Netherlands
- Tipo de documento
- Article
- Idioma
- English
- Palabra clave de autor
- Electromigration Modeling Solder material Thermomigration Thin film
- Palabra clave (fr)
- Assemblage brasage tendre Cavité dans réseau Couche mince Densité courant Densité élevée Diffusion(transport) Défaut cristallin Dépendance température Electrodiffusion Etude théorique Microscopie électronique Modèle atomique Modélisation Nucléation 6172Q 6835F 6855A 8115A Substrat verre
- Palabra clave (in)
- Soldered joints Voids Thin films Current density High density Diffusion Crystal defects Temperature dependence Electrodiffusion Theoretical study Electron microscopy Atomic models Modelling Nucleation
- Palabra clave (es)
- Densidad elevada
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A72 Defects and impurities in crystals; microstructure / 001B60A72Q Microscopic defects (voids, inclusions, etc.)
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35F Diffusion; interface formation
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15A Theory and models of film growth
- Disciplina
- Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 28697422
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.tsf.2014.06.030 
https://dx.doi.org/10.1016/j.tsf.2014.06.030
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