A novel method for SIL verification based on system degradation using reliability block diagram
- Author
- LONG DING1 ; HONG WANG1 ; KAI KANG1 ; KAI WANG1
[1] Key Laboratory of Networked Control Systems, Chinese Academy of Sciences, Shenyang Institute of Automation (SIA), University of Chinese Academy of Sciences (UCAS), No. 114 Nanta Street, Shenyang 110016, China - Source
Reliability engineering & systems safety. 2014, Vol 132, pp 36-45, 10 p ; ref : 25 ref
- ISSN
- 0951-8320
- Scientific domain
- Control theory, operational research; Energy
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Author keyword
- Functional safety IEC 61131-6 IEC 61508 RBD SIL verification System degradation
- Keyword (fr)
- Bloc diagramme Circuit programmable Commande processus Défaillance Dégradation Fiabilité système Norme Redondance Rupture Schéma fonctionnel Sécurité Sûreté fonctionnement Vérification programme Fiabilité circuit intégré Système sécurité
- Keyword (en)
- Block diagram Programmable circuit Process control Failures Degradation System reliability Standards Redundancy Rupture Function block diagram Safety Dependability Program verification Integrated circuit reliability Safety systems
- Keyword (es)
- Diagrama conjunto Circuito programable Control proceso Fallo Degradación Fiabilidad sistema Norma Redundancia Ruptura Esquema funcional Seguridad Seguridad funcionamiento Verificación programa Fiabilidad de circuitos integrados Sistema de seguridad
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A06 Reliability theory. Replacement problems
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06B Integrated circuits by function (including memories and processors)
- Discipline
- Electronics Operational research. Management
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 28808117
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/j.ress.2014.07.005 
https://dx.doi.org/10.1016/j.ress.2014.07.005
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