Plan-view transmission electron microscopy observation of a crack tip in silicon
- Author
- SAKA, H; NAGAYA, G
Nagoya univ., dep. quantum eng., Nagoya 464-01, Japan - Source
Philosophical magazine letters. 1995, Vol 72, Num 4, pp 251-255 ; ref : 16 ref
- CODEN
- PMLEEG
- ISSN
- 0950-0839
- Scientific domain
- Crystallography; Condensed state physics
- Publisher
- Taylor & Francis, London
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Essai Vickers Etude expérimentale Extrémité fissure Faisceau ion Fissure Focalisation Indentation Monocristal Méthode étude Silicium TEM
- Keyword (en)
- Vickers test Experimental study Crack tip Ion beams Cracks Focusing Indentation Monocrystals Investigation method Silicon TEM
- Keyword (es)
- Ensayo Vickers Extremidad fisura Método estudio
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60B Mechanical and acoustical properties of condensed matter / 001B60B20 Mechanical properties of solids / 001B60B20M Fatigue, brittleness, fracture, and cracks
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2895085
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1080/09500839508242459 
https://dx.doi.org/10.1080/09500839508242459
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