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A Study of Pb-Rich Dendrites in a Near-Eutectic 63Sn-37Pb Solder Microstructure via Laboratory-Scale Micro X-ray Computed Tomography (μXCT) : Pb-FREE SOLDERS AND MATERIALS FOR EMERGING INTERCONNECT AND PACKAGING TECHNOLOGIES

Author
MERTENS, J. C. E1 ; WILLIAMS, J. J1 ; CHAWLA, Nikhilesh1
[1] Materials Science & Engineering, Arizona State University, Tempe, AZ 85287, United States
Source

Journal of electronic materials. 2014, Vol 43, Num 12, pp 4442-4456, 15 p ; ref : 40 ref

CODEN
JECMA5
ISSN
0361-5235
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Springer, Heidelberg
Publication country
Germany
Document type
Article
Language
English
Author keyword
63Sn-37Pb Dendrite beam-hardening artifact reduction segmentation solder tomography
Keyword (fr)
Algorithme Analyse quantitative Assemblage bout à bout Assemblage brasage tendre Cavité dans réseau Composition phase Dendrite Durcissement Défaut cristallin Essai non destructif Eutectique Microstructure Mécanisme croissance Packaging électronique Saisie donnée Solidification Tomographie numérique Traitement donnée Traitement matériau 8110A 8130F 8540H 8540L Brasure Substrat cuivre
Keyword (en)
Algorithm Quantitative analysis Butt joint Soldered joint Void Phase composition Dendrite Hardening Crystal defect Non destructive test Eutectic Microstructure Growth mechanism Electronic packaging Data acquisition Solidification Computerized tomography Data processing Material processing Solder
Keyword (es)
Algoritmo Análisis cuantitativo Junta plana Junta soldada Cavidad en red Composición fase Dendrita Endurecimiento Defecto cristalino Ensayo no destructivo Eutéctico Microestructura Mecanismo crecimiento Packaging electrónico Toma dato Solidificación Tratamiento datos Tratamiento material
Keyword (de)
Algorithmus Quantitative Analyse Stumpfstoss Weichloetverbindung Gitterhohlraum Dendrit Haerten Zerstoerungsfreie Pruefung Eutektikum Mikrogefuege Wachstumsmechanismus Datenerfassung Erstarren Datenverarbeitung
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A10 Methods of crystal growth; physics of crystal growth / 001B80A10A Theory and models of crystal growth; physics of crystal growth, crystal morphology and orientation

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A30 Phase diagrams and microstructures developed by solidification and solid-solid phase transformations / 001B80A30F Solidification

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11D Joining, thermal cutting: metallurgical aspects / 001D11D02 Brazing. Soldering

Discipline
Electronics Metals. Metallurgy Physics and materials science
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
28962622

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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