Pinhole defects in Ag sheath of PIT Bi-2212 tapes
- Author
- HAUGAN, T; CHEN, S; PATEL, S; WONG, F; BUSH, P; SHAW, D. T
State univ. New York Buffalo, New York State inst. superconductivity, Amherst NY 14260, United States - Source
Cryogenics (Guildford). 1995, Vol 35, Num 12, pp 853-859 ; ref : 44 ref
- CODEN
- CRYOAX
- ISSN
- 0011-2275
- Scientific domain
- Energy; Condensed state physics; Physics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Courant critique Densité courant critique Défaut Effet dimensionnel Epaisseur Micrographie électronique Piqûre corrosion Ruban Supraconducteur haute température Température critique Bi 2212 Gaine argent Technique poudre dans tube
- Keyword (en)
- Critical current Critical current density Defect Size effect Thickness Electron micrography Pinhole Tape High temperature superconductor Critical temperature Powder in tube technique
- Keyword (es)
- Corriente crítica Densidad corriente crítica Defecto Efecto dimensional Espesor Micrografía electrónica Picadura corrosión Cinta Supraconductor alta temperatura Temperatura crítica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05C Materials
- Discipline
- Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2898383
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0011-2275(95)96882-M 
https://dx.doi.org/10.1016/0011-2275(95)96882-M
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