Influence of niobium addition on microstructure, mechanical properties and oxidation resistance of ZrN coatings

Author

WU, Z. T¹ ; QI, Z. B² ; JIANG, W. F¹ ; WANG, Z. C¹ ; LIU, B³
[1] College of Chemistry and Chemical Engineering, Xiamen University, Xiamen 361005, China
[2] School of Materials Science and Engineering, Xiamen University of Technology, Xiamen 361005, China
[3] Xiamen Annaiwy New Material CO., LTD, Xiamen 361005, China

Conference title

TACT 2013 International Thin Films Conference

Conference name

TACT 2013 International Thin Films Conference (3 ; Taipei 2013-10-05)

Author (monograph)

HUANG, Jia-Hong (Editor)¹ ; WONG, Ming-Show (Editor)² ; CHU, Jinn P (Editor)³ ; HSIEH, Jang-Hsing (Editor)⁴ ; LIANG, Yuan-Chang (Editor)⁵ ; LIN, Ming-Tzer (Editor)⁶ ; HE, Hau (Editor)⁷ ; YANG, Yung-Chin (Editor)⁸ ; CHIU, Te-Wei (Editor)⁸ ; WANG, Fu-Ming (Editor)³
Taiwan Association for Coatings and Thin Films Technology (TACT), Taiwan, Province of China (Organiser of meeting)
[1] National Tsing Hua University, Taiwan, Province of China
[2] Department of Materials Science and Engineering, National Dong Hwa University, Hualien 974, Taiwan, Province of China
[3] National Taiwan University of Science and Technology, Taiwan, Province of China
[4] Ming Chi University of Technology, Taiwan, Province of China
[5] National Taiwan Ocean University, Taiwan, Province of China
[6] National Chung Hsing University, China
[7] National Taiwan University, Taiwan, Province of China
[8] National Taipei University of Technology, Taiwan, Province of China

Source

Thin solid films. 2014, Vol 570, pp 256-261, 6 p ; b ; ref : 39 ref

CODEN

THSFAP

ISSN

0040-6090

Scientific domain

Crystallography; Metallurgy, welding; Condensed state physics

Publisher

Elsevier, Amsterdam

Publication country

Netherlands

Document type

Conference Paper

Language

English

Author keyword

Adhesion Hardness Microstructure Oxidation resistance Zr-Nb―N coatings

Keyword (fr)

Addition niobium Adhérence Dopage Dureté Dépôt physique phase vapeur Dépôt pulvérisation Effet Hall Empreinte dureté Essai dureté Essai rayage Microstructure Nanodureté Nanoindentation Orientation préférentielle Oxydation Propriété mécanique Propriété électrique Pulvérisation cathodique Relation composition structure Relation structure propriété Revêtement Réseau monoclinique Réseau quadratique Solution solide Structure basaltique Structure cristalline Structure solution Tribologie 6855J 6860B 7350 8115C ZrN ZrO2

Keyword (en)

Niobium additions Adhesion Doping Hardness Physical vapor deposition Sputter deposition Hall effect Hardness indentation Hardness testing Scratching test Microstructure Nanohardness Nanoindentation Preferred orientation Oxidation Mechanical properties Electrical properties Cathode sputtering Structure composition relationship Property structure relationship Coatings Monoclinic lattices Tetragonal lattices Solid solutions Columnar structure Crystal structure Solution structure Tribology

Keyword (es)

Doping Indentación dureza Ensayo al rayado Nanodureza Nanoindentacion Orientación preferencial Relación composición estructura Relación estructura propiedad Estructura columnar Estructura solución

Classification

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness

Pascal

001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H60 Physical properties of thin films, nonelectronic / 001B60H60B Mechanical and acoustical properties

Pascal

001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C50 Electronic transport phenomena in thin films and low-dimensional structures

Pascal

001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15C Deposition by sputtering

Discipline

Physics and materials science Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties

Origin

Inist-CNRS

Database

PASCAL

INIST identifier

29013954

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS