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Measurement of high frequency permeance of soft magnetic thin films at large field

Author
YAMAGUCHI, M1 ; YOSHIDA, S; ARAI, K. I1 ; HAGA, A
[1] Tohoku univ., res. inst. electrical communication, Aoba-ku, Sendai 980-77, Japan
Conference title
INTERMAG'95 : IEEE international magnetics conference
Conference name
INTERMAG'95 : IEEE international magnetics conference (33 ; San Antonio TX 1995-04-18)
Author (monograph)
BUSH, Gary G (Editor)1 ; CAIN, William C (Editor); ERWIN, Ross (Editor); KIM, Young K (Editor); OTI, John (Editor); RAMANAN, V. R (Editor); RE, Mark E (Editor)
IEEE ; Magnetics Society, New York NY, United States (Funder/Sponsor)
[1] Lockheed Missiles and Space Co., Palo Alto CA, United States
Source

IEEE transactions on magnetics. 1995, Vol 31, Num 6, pp 3379-3381 ; 1 ; ref : 8 ref

CODEN
IEMGAQ
ISSN
0018-9464
Scientific domain
Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Couche mince Dispositif magnétique Enroulement Etude expérimentale Ferromagnétique Haute fréquence Mesure magnétique Perméance
Keyword (en)
Thin films Magnetic device Winding Experimental study Ferromagnetic materials High frequency Magnetic measurement Permeance
Keyword (es)
Dispositivo magnético Arrollamiento Material ferromagnético Alta frecuencia Medida magnética Permeancia
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F10 Magnetic devices

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
2911879

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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