Structural relaxation and the photoplastic effect in amorphous semiconductors
- Author
- TRUNOV, M. L
Uzhgorod State univ., Uzhgorod 294000, Ukraine - Conference title
- International conference on the structure of non-crystalline materials (NCM6)
- Conference name
- International conference on the structure of non-crystalline materials (NCM6) (NCM6) (6 ; Prague 1994-08-29)
- Author (monograph)
- CERVINKA, L (Editor)1 ; WRIGHT, A. C (Editor)
Institute of Physics, Prague, Czech Republic (Funder/Sponsor)
Commission of the European Communities ; Directoriat general for science, research and development, Brussels, Belgium (Funder/Sponsor)
UNESCO ; Czech Commission, Prague, Czech Republic (Funder/Sponsor)
International Union of Pure and Applied Physics, International (Funder/Sponsor)
International Science Foundation, Washington DC, United States (Funder/Sponsor)
[1] Acad. sci. Czech Republic ; inst. physics, 162 00 Prague, Czech Republic - Source
Journal of non-crystalline solids. 1995, Vol 192-93, pp 431-434 ; ref : 10 ref
- CODEN
- JNCSBJ
- ISSN
- 0022-3093
- Scientific domain
- Crystallography; Chemical industry parachemical industry; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Arsenic sulfure Cinétique Composé binaire Contrainte Couche mince Couche épaisse Etat amorphe Etude expérimentale Matériau semiconducteur Photoplasticité Photosensibilisation Relaxation structurale As S As2S3 Composé minéral
- Keyword (en)
- Arsenic sulfides Kinetics Binary compounds Stresses Thin films Thick film Amorphous state Experimental study Semiconductor materials Photoplasticity Photosensitization Structure relaxation Inorganic compounds
- Keyword (es)
- Capa espesa Fotoplasticidad Fotosensibilización Relajación estructural
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 2973986
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0022-3093(95)00480-7 
https://dx.doi.org/10.1016/0022-3093(95)00480-7
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