Modern applications of a new 300 kV field emission transmission electron microscope to the study of advanced materials
- Author
- BANDO, Y1 ; KURASHIMA, K1 ; NAKANO, S1
[1] National Institute for Research in Inorganic Materials, 1-Namiki, Tsukuba, Ibaraki 305, Japan - Conference title
- Modern applications of electron and scanning probe microscopies to ceramics
- Conference name
- Microscopy Session _ ECerS Conference (4 ; Riccione 1995-10-02)
- Author (monograph)
- European Ceramic Society, Europe (Funder/Sponsor)
- Source
Journal of the European Ceramic Society. 1996, Vol 16, Num 3, pp 379-384 ; ref : 15 ref
- ISSN
- 0955-2219
- Scientific domain
- Chemical industry parachemical industry
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Aluminium nitrure Analyse chimique Analyse quantitative Bore carbure Bore nitrure Composé binaire Composé ternaire Image réticulaire Microscope émission champ Microscopie électronique transmission Méthode haute résolution Polytypisme Structure cristalline Al N B C N Composé minéral
- Keyword (en)
- Aluminium nitrides Chemical analysis Quantitative chemical analysis Boron carbide Boron nitrides Binary compounds Ternary compounds Lattice image Field emission microscopes Transmission electron microscopy High-resolution methods Polytypism Crystal structure Inorganic compounds
- Keyword (es)
- Imagen reticular
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16B Transmission, reflection and scanning electron microscopy(including ebic)
- Discipline
- Metrology Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3019185
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0955-2219(95)00087-9 
https://dx.doi.org/10.1016/0955-2219(95)00087-9
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