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Modern applications of a new 300 kV field emission transmission electron microscope to the study of advanced materials

Author
BANDO, Y1 ; KURASHIMA, K1 ; NAKANO, S1
[1] National Institute for Research in Inorganic Materials, 1-Namiki, Tsukuba, Ibaraki 305, Japan
Conference title
Modern applications of electron and scanning probe microscopies to ceramics
Conference name
Microscopy Session _ ECerS Conference (4 ; Riccione 1995-10-02)
Author (monograph)
European Ceramic Society, Europe (Funder/Sponsor)
Source

Journal of the European Ceramic Society. 1996, Vol 16, Num 3, pp 379-384 ; ref : 15 ref

ISSN
0955-2219
Scientific domain
Chemical industry parachemical industry
Publisher
Elsevier, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Keyword (fr)
Aluminium nitrure Analyse chimique Analyse quantitative Bore carbure Bore nitrure Composé binaire Composé ternaire Image réticulaire Microscope émission champ Microscopie électronique transmission Méthode haute résolution Polytypisme Structure cristalline Al N B C N Composé minéral
Keyword (en)
Aluminium nitrides Chemical analysis Quantitative chemical analysis Boron carbide Boron nitrides Binary compounds Ternary compounds Lattice image Field emission microscopes Transmission electron microscopy High-resolution methods Polytypism Crystal structure Inorganic compounds
Keyword (es)
Imagen reticular
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques

Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60A Structure of solids and liquids; crystallography / 001B60A16 Electron, ion, and scanning probe microscopy / 001B60A16B Transmission, reflection and scanning electron microscopy(including ebic)

Pacs
0778 Electron, positron, and ion microscopes, electron diffractometers, and related techniques

Discipline
Metrology Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3019185

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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