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Practical optoelectronic neural network realizations based on the fault tolerance of the backpropagation algorithm

Author
ALLEN, T. J1 ; HUNG, K.-S1 ; CURTIS, K. M1 ; ORTON, J. W1
[1] Department of Electrical and Electronic Engineering, University of Nottingham, Nottingham NG7 2RD, United Kingdom
Source

IEEE transactions on neural networks. 1996, Vol 7, Num 2, pp 488-500 ; ref : 19 ref

CODEN
ITNNEP
ISSN
1045-9227
Scientific domain
Electronics; Computer science; Psychology, psychopathology, psychiatry
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Circuit VLSI Diaphonie Optoélectronique Réalisation système Réseau neuronal Rétropropagation Tolérance faute
Keyword (en)
VLSI circuit Crosstalk Optoelectronics System realization Neural network Backpropagation Fault tolerance
Keyword (es)
Circuito VLSI Diafonía Optoelectrónica Realización sistema Red neuronal Retropropagacíon Tolerancia falta
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G03 Neural networks

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3039507

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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