Plastic-encapsulated microcircuit reliability & cost-effectiveness study
- Author
- EMERSON, D1 ; HAKIM, E; GOVIND, A
[1] Rockwell International, Cedar Rapids, United States - Source
IEEE transactions on reliability. 1996, Vol 45, Num 1, pp 19-22 ; ref : 3 ref
- CODEN
- IEERAJ
- ISSN
- 0018-9529
- Scientific domain
- Control theory, operational research; Electronics
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse coût efficacité Analyse coût Application militaire Carte électronique Encapsulation plastique Etude comparative Etude expérimentale Fiabilité Microcircuit
- Keyword (en)
- Cost efficiency analysis Cost analysis Military application Printed circuit board Plastic packaging Comparative study Experimental study Reliability Microcircuit
- Keyword (es)
- Análisis costo eficacia Análisis costo Aplicación militar Tarjeta electronica Encapsulación plástica Estudio comparativo Estudio experimental Fiabilidad Microcircuito
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3092141
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/24.488910 
https://dx.doi.org/10.1109/24.488910
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