Porous silicon via freeze drying
- Author
- AMATO, G1 ; BRUNETTO, N1
[1] Istituto Elettrotecnico Nazionale Galileo Ferraris, Str. delle Cacce 91, 10135 Turin, Italy - Source
Materials letters (General ed.). 1996, Vol 26, Num 6, pp 295-298 ; ref : 10 ref
- CODEN
- MLETDJ
- ISSN
- 0167-577X
- Scientific domain
- Crystallography; Chemical industry parachemical industry; Condensed state physics; Polymers, paint and wood industries
- Publisher
- Elsevier, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Application Capteur mesure Caractérisation Etude expérimentale Lyophilisation Matériau poreux Microscopie électronique balayage Morphologie Optoélectronique Pastille électronique Porosité Préparation Silicium Structure cristalline Structure stratifiée Sublimation Propriété optique
- Keyword (en)
- Application Measurement sensor Characterization Experimental study Freeze drying Porous material Scanning electron microscopy Morphology Optoelectronics Wafer Porosity Preparation Silicon Crystalline structure Laminated structure Sublimation Optical properties
- Keyword (es)
- Aplicación Captador medida Caracterización Estudio experimental Liofilización Material poroso Microscopía electrónica barrido Morfología Optoelectrónica Pastilla electrónica Porosidad Preparación Silicio Estructura cristalina Estructura estratificada Sublimación Propiedad óptica
- Classification
- Pascal
- 001 Exact sciences and technology / 001C Chemistry / 001C01 General and physical chemistry / 001C01J Colloidal state and disperse state / 001C01J08 Porous materials
- Discipline
- General chemistry and physical chemistry
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3094100
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0167-577X(95)00244-8 
https://dx.doi.org/10.1016/0167-577X(95)00244-8
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