An improved method for symbolic reliability analysis
- Author
- SHEN, Y1
[1] Nanjing Institute of Posts and Telecommunications, Nanjing, China - Source
Microelectronics and reliability. 1996, Vol 36, Num 5, pp 631-635 ; ref : 13 ref
- CODEN
- MCRLAS
- ISSN
- 0026-2714
- Scientific domain
- Electronics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Fiabilité système Réseau Théorie graphe Somme produit disjoint
- Keyword (en)
- System reliability Network Graph theory
- Keyword (es)
- Fiabilidad sistema Red Teoría grafo
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D01 Operational research. Management science / 001D01A Operational research and scientific management / 001D01A04 Flows in networks. Combinatorial problems
- Discipline
- Operational research. Management
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3100384
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0026-2714(95)00166-2 
https://dx.doi.org/10.1016/0026-2714(95)00166-2
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