All-optical mass spectrometric system based on picosecond laser pulses
- Author
- SCHÜTZE, M1 ; TRAPPE, C1 ; TABELLION, M1 ; LÜPKE, G1 ; KURZ, H1
[1] Institute of Semiconductor Electronics, RWTH Aachen, 52056 Aachen, Germany - Source
Surface and interface analysis. 1996, Vol 24, Num 6, pp 399-404 ; ref : 22 ref
- CODEN
- SIANDQ
- ISSN
- 0142-2421
- Scientific domain
- General chemistry, physical chemistry; Nanotechnologies, nanostructures, nanoobjects; Condensed state physics
- Publisher
- Wiley, Chichester
- Publication country
- United Kingdom
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse surface Désorption laser Emission particule Etude expérimentale Gallium arséniure Impulsion laser Matériau semiconducteur Picoseconde Pulvérisation irradiation Spectrométrie masse Température surface As Ga GaAs
- Keyword (en)
- Surface analysis Laser desorption Particle emission Experimental study Gallium arsenides Laser pulse Semiconductor materials Picosecond Sputtering Mass spectroscopy Surface temperature
- Keyword (es)
- Desorción láser Emisión partícula Impulsión láser Picosegundo
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70I Electron and ion emission by liquids and solids; impact phenomena / 001B70I20 Impact phenomena (including electron spectra and sputtering) / 001B70I20D Laser-beam impact phenomena
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3115538
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1002/(SICI)1096-9918(199606)24:6<399::AID-SIA134>3.0.CO;2-N 
https://dx.doi.org/10.1002/(SICI)1096-9918(199606)24:6<399::AID-SIA134>3.0.CO;2-N
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