Polarization effects in X-ray/matter interactions : Special issue on micro- and ultratrace X-ray fluorescence analysis
- Author
- FERNANDEZ, J. E1
[1] National Institute of Physics of Matter (INFM) and Laboratory of Montecuccolino, Department of Energetics, Nuclear and Environmental Control Engineering, University of Bologna, Via dei Colli 16, 40136 Bologna, Italy - Source
Journal of trace and microprobe techniques. 1996, Vol 14, Num 3, pp 489-516 ; ref : 55 ref
- CODEN
- JTMTDE
- ISSN
- 0733-4680
- Scientific domain
- Analytical chemistry
- Publisher
- Dekker, Monticello, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse fluorescence RX Code informatique Diffusion Rayleigh Diffusion multiple Effet Compton Effet photoélectrique Elément trace Faisceau polarisé Polarisation rectiligne Rayonnement synchrotron
- Keyword (en)
- X-ray fluorescence analysis Computer codes Rayleigh scattering Multiple scattering Compton effect Photoelectric effect Trace elements Polarized beams Linear polarization Synchrotron radiation
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques / 001B00G85Q Synchrotron radiation instrumentation
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3172722
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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