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Polarization effects in X-ray/matter interactions : Special issue on micro- and ultratrace X-ray fluorescence analysis

Author
FERNANDEZ, J. E1
[1] National Institute of Physics of Matter (INFM) and Laboratory of Montecuccolino, Department of Energetics, Nuclear and Environmental Control Engineering, University of Bologna, Via dei Colli 16, 40136 Bologna, Italy
Source

Journal of trace and microprobe techniques. 1996, Vol 14, Num 3, pp 489-516 ; ref : 55 ref

CODEN
JTMTDE
ISSN
0733-4680
Scientific domain
Analytical chemistry
Publisher
Dekker, Monticello, NY
Publication country
United States
Document type
Article
Language
English
Keyword (fr)
Analyse fluorescence RX Code informatique Diffusion Rayleigh Diffusion multiple Effet Compton Effet photoélectrique Elément trace Faisceau polarisé Polarisation rectiligne Rayonnement synchrotron
Keyword (en)
X-ray fluorescence analysis Computer codes Rayleigh scattering Multiple scattering Compton effect Photoelectric effect Trace elements Polarized beams Linear polarization Synchrotron radiation
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques / 001B00G85Q Synchrotron radiation instrumentation

Pacs
0785Q Synchrotron radiation instrumentation

Discipline
Metrology
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3172722

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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