An investigation of the friction and wear properties of nanometer Si3N4 filled PEEK
- Author
- WANG, Q1 ; XU, J1 ; SHEN, W1 ; LIU, W1
[1] Laboratory of Solid Lubrication, Lanzhou Institute of Chemical Physics, Chinese Academy of Sciences, Lanzhou 730000, China - Source
Wear. 1996, Vol 196, Num 1-2, pp 82-86 ; ref : 13 ref
- CODEN
- WEARAH
- ISSN
- 0043-1648
- Scientific domain
- Chemical engineering; Mechanical engineering; Mechanics acoustics; Metallurgy, welding
- Publisher
- Elsevier Science, Amsterdam
/
Elsevier Science, Lausanne
/
Elsevier Science, New York, NY
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse surface Etherethercétone polymère Etude expérimentale Frottement Matériau composite Matériau renforcé dispersion Morphologie Nanostructure Relation composition propriété Résistance usure Silicium Nitrure Propriété mécanique
- Keyword (en)
- Surface analysis Polyetheretherketone Experimental study Friction Composite material Dispersion reinforced material Morphology Nanostructure Property composition relationship Wear resistance Silicon Nitrides Mechanical properties
- Keyword (es)
- Análisis superficie Eter éter cetona polímero Estudio experimental Frotamiento Material compuesto Material renforzado dispersión Morfología Nanoestructura Relación composición propiedad Resistencia al desgaste Silicio Nitruro Propiedad mecánica
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D10 Polymer industry, paints, wood / 001D10A Technology of polymers / 001D10A06 Forms of application and semi-finished materials / 001D10A06H Composites
- Discipline
- Polymer industry, paints, wood
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3183120
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0043-1648(95)06866-X 
https://dx.doi.org/10.1016/0043-1648(95)06866-X
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