Preparation of thin silver films on mica studied by XRD and AFM
- Author
- GRUNWALDT, J.-D1 ; ATAMNY, F1 ; GÖBEL, U1 ; BAIKER, A1
[1] Department of Chemical Engineering and Industrial Chemistry, Swiss Federal Institute of Technology, ETH-Zentrum, 8092 Zürich, Switzerland - Source
Applied surface science. 1996, Vol 99, Num 4, pp 353-359 ; ref : 23 ref
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Argent Couche mince Croissance cristalline Effet dimensionnel Effet température Etude expérimentale Evaporation Microscopie force atomique Métal transition Relation fabrication propriété Structure surface Structure îlot XRD Ag
- Keyword (en)
- Silver Thin films Crystal growth Size effect Temperature effects Experimental study Evaporation Atomic force microscopy Transition elements Fabrication property relation Surface structure Island structure XRD
- Keyword (es)
- Relación fabricación propiedad
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Metals. Metallurgy Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3187961
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0169-4332(95)00600-1 
https://dx.doi.org/10.1016/0169-4332(95)00600-1
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