Amorphous semiconducting film containing nanometer particles of CuTCNQ : preparation, characterization and electrical switching property
- Author
- LIU, S.-G1 ; LIU, Y.-Q1 ; ZHU, D.-B1
[1] Institute of Chemistry, Academia Sinica, Beijing 100080, China - Source
Thin solid films. 1996, Vol 280, Num 1-2, pp 271-277 ; ref : 31 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Analyse spectrale Caractérisation Caractéristique courant tension Composé organique Composé transfert charge Couche mince Etude expérimentale Fabrication microélectronique Matériau amorphe Microélectronique Nanostructure Semiconducteur amorphe Semiconducteur Spectrométrie Fourier
- Keyword (en)
- Spectral analysis Characterization Voltage current curve Organic compounds Charge transfer compound Thin film Experimental study Microelectronic fabrication Amorphous material Microelectronics Nanostructure Amorphous semiconductors Semiconductor materials Fourier spectrometry
- Keyword (es)
- Análisis espectral Caracterización Característica corriente tensión Compuesto orgánico Compuesto transferencia carga Capa fina Estudio experimental Fabricación microeléctrica Material amorfo Microelectrónica Nanoestructura Semiconductor(material) Espectrometría Fourier
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3192336
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(95)08235-2 
https://dx.doi.org/10.1016/0040-6090(95)08235-2
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