Polarized light scattering in dielectric layers with rough interfaces
- Author
- DOGARIU, M1 ; ASAKURA, T2
[1] Department of Physics, University of Central Florida, Orlando, FL 32816-2385, United States
[2] Research Institute for Electronic Science, Hokkaido University, Sapporo 060, Japan - Source
Optics communications. 1996, Vol 131, Num 1-3, pp 1-7 ; ref : 17 ref
- CODEN
- OPCOB8
- ISSN
- 0030-4018
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffusion lumière Diffusion multiple Etude théorique Faisceau polarisé Interface Matériau diélectrique Optique géométrique Surface rugueuse Tracé rayon
- Keyword (en)
- Light scattering Multiple scattering Theoretical study Polarized beams Interfaces Dielectric materials Geometrical optics Rough surface Ray tracing
- Keyword (es)
- Superficie rugosa
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B40 Fundamental areas of phenomenology (including applications) / 001B40B Optics / 001B40B25 Wave optics / 001B40B25F Diffraction and scattering
- Discipline
- Physics : optics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3218820
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0030-4018(96)00221-0 
https://dx.doi.org/10.1016/0030-4018(96)00221-0
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