Morphological transition of Sn particles on Si substrate induced by ion irradiation
- Author
- TAKAHIRO, K1 ; SUGAWARA, M1 ; NAGATA, S1 ; YAMAGUCHI, S1
[1] Institute for Materials Research, Tohoku University, Sendai 980-77, Japan - Conference title
- International Conference on Surface Modification of Metals by Ion Beams (SMMIB)
- Conference name
- International Conference on Surface Modification of Metals by Ion Beams (SMMIB) (SMMIB) (9 ; San Sebastian 1995-09-04)
- Author (monograph)
- ONATE, J. I (Editor)1 ; SARTWELL, B. D (Editor); GUZMAN, L (Editor)2
INASMET, San Sebastian, Spain (Funder/Sponsor)
[1] ISNASMET, San Sebastian, Spain
[2] CMBM, Trento, Italy - Source
Surface & coatings technology. 1996, Vol 83, Num 1-3, pp 99-102 ; ref : 9 ref
- CODEN
- SCTEEJ
- ISSN
- 0257-8972
- Scientific domain
- General chemistry, physical chemistry; Metallurgy, welding
- Publisher
- Elsevier, Lausanne
- Publication country
- Switzerland
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Amorphisation Couche mince Dépôt phase vapeur Etain Etude expérimentale Evaporation Interface Irradiation ion Irradiation Morphologie Mouillage Rétrodiffusion Rutherford SEM Silicium
- Keyword (en)
- Amorphization Thin films Vapor deposition Tin Experimental study Evaporation Interfaces Ion irradiation Irradiation Morphology Wetting Rutherford backscattering SEM Silicon
- Keyword (es)
- Depósito fase vapor Irradiación ión Retrodifusión Rutherford
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55L Defects and impurities: doping, implantation, distribution, concentration, etc
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3228444
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0257-8972(95)02837-4 
https://dx.doi.org/10.1016/0257-8972(95)02837-4
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