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Polariton modes in semiconductor superlattices

Author
SHI, J.-J1 2 ; LIU, Z.-X2 ; PAN, S.-H1 3
[1] CCAST (World Laboratory), P.O. Box 8730, Beijing 100080, China
[2] Department of Physics, Henan Normal University, Xinxiang 453002, Henan, China
[3] Institute of Physics, Chinese Academy of Sciences, P.O. Box 603, Beijing 100080, China
Source

Zeitschrift für Physik. B, Condensed matter. 1996, Vol 101, Num 3, pp 367-371 ; ref : 16 ref

CODEN
ZPCMDN
ISSN
0722-3277
Scientific domain
Condensed state physics
Publisher
Springer, Berlin / Springer, Heidelberg / Springer, New-York, NY
Publication country
Germany
Document type
Article
Language
English
Keyword (fr)
Champ électrique Epaisseur Etude théorique Matériau semiconducteur Méthode numérique Polariton Relation dispersion Répartition spatiale Théorie Bloch
Keyword (en)
Electric fields Thickness Theoretical study Semiconductor materials Numerical method Polaritons Dispersion relations Spatial distribution Bloch theory
Keyword (es)
Método numérico
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70C Electronic structure and electrical properties of surfaces, interfaces, thin films and low-dimensional structures / 001B70C20 Surface and interface electron states / 001B70C20M Collective excitations (including excitons, polarons, plasmons and other charge-density excitations)

Pacs
7320M Collective excitations (including plasmons and other charge-density excitations)

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3242992

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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