Possible cause of the memory effect observed in nickel-cadmium secondary batteries
- Author
- SATO, Y1 ; ITO, K1 ; ARAKAWA, T1 ; KOBAYAKAWA, K1
[1] Department of Applied Chemistry, Faculty of Engineering, Kanagawa University, 3-27-1 Rokkakubashi, Kanagawa-ku, Yokohama 221, Japan - Source
Journal of the Electrochemical Society. 1996, Vol 143, Num 10, pp L225-L228 ; ref : 12 ref
- CODEN
- JESOAN
- ISSN
- 0013-4651
- Scientific domain
- General chemistry, physical chemistry; Crystallography; Electrical engineering; Condensed state physics
- Publisher
- Electrochemical Society, Pennington, NJ
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Batterie Cadmium Capacité énergétique Caractéristique électrique Cycle charge décharge Diffraction RX Effet mémoire Microscopie électronique balayage Nickel Structure surface
- Keyword (en)
- Battery Cadmium Energetic capacity Electrical characteristic Discharge charge cycle X ray diffraction Memory effect Scanning electron microscopy Nickel Surface structure
- Keyword (es)
- Batería Cadmio Capacidad energética Característica eléctrica Ciclo carga descarga Difracción RX Efecto memoria Microscopía electrónica barrido Niquel Estructura superficie
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05I Electrical power engineering / 001D05I03 Direct energy conversion and energy accumulation / 001D05I03E Electrochemical conversion: primary and secondary batteries, fuel cells
- Discipline
- Electrical engineering. Electroenergetics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3252531
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1149/1.1837152 
https://dx.doi.org/10.1149/1.1837152
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