Light and temperature effect on pin a-Si:H device performance
- Author
- VIEIRA, M; FORTUNATO, E; LAVAREDA, G; CARVALHO, C. N; MARTINS, R
FCT-UNL/UNINOVA, 2825 Monte da Caparica, Portugal - Conference title
- ETCHC-1 : European topical conference on hard coatings
- Conference name
- ETCHC-1 : European topical conference on hard coatings (1 ; Alicante 1993-07-12) = Iberian vacuum meeting (2 ; Alicante 1993-07-12)
- Author (monograph)
- DE SEGOVIA, José L (Editor)1 ; LARANJEIRA, M. F (Editor)
Spanish Vacuum Society, Spain (Funder/Sponsor)
Portuguese Vacuum Society, Portugal (Funder/Sponsor)
[1] CSIC, inst. cienc. materiales, Madrid, Spain - Source
Vacuum. 1994, Vol 45, Num 10-11, pp 1147-1149 ; ref : 9 ref
- CODEN
- VACUAV
- ISSN
- 0042-207X
- Scientific domain
- Metallurgy, welding; Physics
- Publisher
- Elsevier, Oxford
- Publication country
- United Kingdom
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Aiguille Cellule solaire Conversion photovoltaïque Eclairement Effet température Formation défaut Matériau amorphe Performance Résultat expérimental Silicium Silicium amorphe
- Keyword (en)
- Needle Solar cell Photovoltaic conversion Illumination Temperature effect Defect formation Amorphous material Performance Experimental result Silicon
- Keyword (es)
- Aguja Célula solar Conversión fotovoltaica Alumbrado Efecto temperatura Formación defecto Material amorfo Rendimiento Resultado experimental Silicio
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D06 Energy / 001D06C Natural energy / 001D06C02 Solar energy / 001D06C02D Photovoltaic conversion / 001D06C02D1 Solar cells. Photoelectrochemical cells
- Discipline
- Energy
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3323114
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0042-207X(94)90049-3 
https://dx.doi.org/10.1016/0042-207X(94)90049-3
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