The HELIOS series of advanced, synchroton based, X-ray sources
- Author
- KEMPSON, V. C; JORDEN, A. R; CROSLAND, N. C. E; WILSON, M. N; SCHOUTEN, J. C; TOWNSEND, M. C; ANDERSON, R. J
Oxford Instruments, accelerator technology group, Oxford OX2 0DX, United Kingdom - Conference title
- Nanometer-scale methods in X-ray technology. European industrial workshop
- Conference name
- Nanometer-scale methods in X-ray technology. European industrial workshop (1 ; Veldhoven 1993-10-11)
- Source
Journal de physique. III (Print). 1994, Vol 4, Num 9, pp 1679-1686 ; ref : 6 ref
- ISSN
- 1155-4320
- Scientific domain
- Mechanics acoustics; Condensed state physics; Plasma physics
- Publisher
- Editions de physique, Les Ulis
- Publication country
- France
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Anneau stockage Application Etude expérimentale Lithographie Rayon X Rayonnement synchrotron Source RX
- Keyword (en)
- Storage rings Application Experimental study Lithography X radiation Synchrotron radiation X-ray sources
- Keyword (es)
- Aplicación
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G85 X- and γ-ray instruments and techniques / 001B00G85F X- and γ-ray sources, mirrors, gratings and detectors
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F17 Microelectronic fabrication (materials and surfaces technology)
- Discipline
- Electronics Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3344094
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1051/jp3:1994233 
https://dx.doi.org/10.1051/jp3:1994233
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