Image formation by inelastically scattered electrons in TEM and STEM
- Author
- FUJIMOTO, F; MAZEL, A; SEVELY, J
CNRS, CEMES-LOE, 31055 Toulouse, France - Source
Ultramicroscopy. 1994, Vol 55, Num 3, pp 253-257 ; ref : 14 ref
- CODEN
- ULTRD6
- ISSN
- 0304-3991
- Scientific domain
- Cell biology, histology; Crystallography; Physics
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Article
- Language
- English
- Keyword (fr)
- Diffusion inélastique Diffusion électron Etude expérimentale Formation image Microscopie électronique STEM TEM
- Keyword (en)
- Inelastic scattering Electron scattering Experimental study Image forming Electron microscopy STEM TEM
- Keyword (es)
- Difusión electrón
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B00 General / 001B00G Instruments, apparatus, components and techniques common to several branches of physics and astronomy / 001B00G78 Electron, positron and ion microscopes, electron diffractometers and related techniques
- Discipline
- Metrology
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3348841
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0304-3991(94)90059-0 
https://dx.doi.org/10.1016/0304-3991(94)90059-0
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