In-situ measurement of electric fields at individual grain boundaries in TiO2
- Author
- BONNELL, D. A; HUEY, B; CARROLL, D
Univ. Pennsylvania, dep. materials sci., Philadelphia PA 19104, United States - Conference title
- Interfaces in ionic materials
- Conference name
- Interfaces in ionic materials (Schloss Ringberg 1994-03-07)
- Author (monograph)
- MAIER, JOACHIM (Editor)1 ; RAJ, RISHI (Editor); RüHLE, MANFRED (Editor)
[1] Max-Planck-Inst. Festkörperforschung, Stuttgart, Germany - Source
Solid state ionics. 1995, Vol 75, pp 35-42 ; ref : 17 ref
- CODEN
- SSIOD3
- ISSN
- 0167-2738
- Scientific domain
- Crystallography; Condensed state physics; Polymers, paint and wood industries
- Publisher
- Elsevier Science, Amsterdam
- Publication country
- Netherlands
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Champ local Etat défaut Etude expérimentale Gradient champ électrique Joint grain Microscopie force atomique Titane oxyde O Ti TiO2 Composé minéral Métal transition composé
- Keyword (en)
- Local field Defect states Experimental study Electric field gradients Grain boundaries Atomic force microscopy Titanium oxides Inorganic compounds Transition element compounds
- Keyword (es)
- Campo local
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70A Electron states / 001B70A55 Impurity and defect levels / 001B70A55H Other nonmetals
- Pacs
- 7155H Other nonmetals
- Discipline
- Physics of condensed state : electronic structure, electrical, magnetic and optical properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3428518
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0167-2738(94)00180-Z 
https://dx.doi.org/10.1016/0167-2738(94)00180-Z
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