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Measurement of capacitance transients with attoFarad resolution in a microwave varactor diode after Co60 irradiation

Author
SCARPULLA, J; YOUNG, A. M; CHEN, J
Aerospace Corp., El Segundo CA 90245, United States
Conference title
IEEE annual conference on nuclear and space radiation effects NSREC'94
Conference name
IEEE annual conference on nuclear and space radiation effects NSREC'94 (31 ; Tucson AZ 1994-07-18)
Author (monograph)
BOESCH, H. EDWIN (Editor)1
IEEE, International (Funder/Sponsor)
[1] Army res. lab., Adelphi MD 20783-1197, United States
Source

IEEE transactions on nuclear science. 1994, Vol 41, Num 6, pp 2502-2510 ; 1 ; ref : 15 ref

CODEN
IETNAE
ISSN
0018-9499
Scientific domain
Energy
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Capacité électrique Caractéristique capacité tension Cobalt Isotope Diode hyperfréquence Diode varactor Etude expérimentale Fiabilité Irradiation gamma Méthode mesure Oscillateur commande tension Radioisotope Résistance rayonnement Cobalt 60
Keyword (en)
Capacitance Voltage capacity curve Cobalt Isotopes Microwave diode Varactor diode Experimental study Reliability Gamma irradiation Measurement method Voltage controlled oscillator Radioisotope Radiation resistance
Keyword (es)
Capacitancia Característica capacidad tensión Cobalto Isótopo Diodo hiperfrecuencia Diodo varactor Estudio experimental Fiabilidad Irradiación gama Método medida Oscilador comando tensión Radionúclido Resistencia radiación
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03B Testing, measurement, noise and reliability

Discipline
Electronics
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3435012

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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