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Reduction of interface contamination in regrown GaAs on AlGaAs using a novel two-step HCl gas etching process

Author
KIZUKI, H; FUJII, N; MIYASHITA, M; MIHASHI, Y; TAKAMIYA, S
Mitsubishi Electric Corp., optoelectronic microwave devices lab., Itami City, Hyogo 664, Japan
Conference title
Vapour growth and epitaxy 1994
Conference name
ICVGE 8. International conference (8 ; Freiburg 1994-07-24)
Author (monograph)
MULLIN, J. B (Editor)1
German Association of Cristal Growth, Germany (Funder/Sponsor)
International Organisation of Crystal Growth, International (Funder/Sponsor)
[1] Electronic material consultancy, Malvern, United Kingdom
Source

Journal of crystal growth. 1995, Vol 146, Num 1-4, pp 527-532 ; ref : 13 ref

CODEN
JCRGAE
ISSN
0022-0248
Scientific domain
Crystallography; Geology; Metallurgy, welding
Publisher
Elsevier, Amsterdam
Publication country
Netherlands
Document type
Conference Paper
Language
English
Keyword (fr)
Aluminium arséniure CVD Composé binaire Composé ternaire Contamination Densité dislocation Etude expérimentale Gallium arséniure Gravure Interface solide solide Matériau semiconducteur Perfection cristalline Surcouche Traitement surface Al As Ga AlGaAs As Ga GaAs Composé minéral Composé organométallique
Keyword (en)
Aluminium arsenides CVD Binary compounds Ternary compounds Contamination Dislocation density Experimental study Gallium arsenides Etching Solid-solid interfaces Semiconductor materials Crystal perfection Overlayers Surface treatments Inorganic compounds Organometallic compounds
Keyword (es)
Densidad dislocación Perfección cristalina
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H35 Solid surfaces and solid-solid interfaces / 001B60H35D Composition; defects and impurities

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A15 Methods of deposition of films and coatings; film growth and epitaxy / 001B80A15G Chemical vapor deposition (including plasma-enhanced cvd, mocvd, etc.)

Pascal
001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A65 Surface treatments

Pacs
6835D Composition; defects and impurities

Pacs
8115G Chemical vapor deposition (including plasma-enhanced CVD, MOCVD, etc.)

Pacs
8165 Surface treatments

Discipline
Physics and materials science Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3437942

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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