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Surface strains and measurements of misfit dislocation density by diffraction methods in thin films on substrates

Author
JUNQUA, N; GRILHE, J
CNRS Univ. Poitiers, lab. métallurgie physique, 86022 Poitiers, France
Source

Thin solid films. 1994, Vol 250, Num 1-2, pp 37-41 ; ref : 12 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier Science, Lausanne
Publication country
Switzerland
Document type
Article
Language
English
Keyword (fr)
Contrainte Correction erreur Couche mince Couche épitaxique Densité dislocation Diffraction Dislocation interfaciale Défaut cristallin Déformation superficielle Epaisseur Epitaxie Etude expérimentale Propriété mécanique
Keyword (en)
Stresses Error correction Thin films Epitaxial layers Dislocation density Diffraction Misfit dislocations Crystal defects Surface deformation Thickness Epitaxy Experimental study Mechanical properties
Keyword (es)
Corrección error Densidad dislocación Deformación superficial
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness

Pacs
6855J Structure and morphology; thickness

Discipline
Physics of condensed state : structure, mechanical and thermal properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3455237

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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