Surface strains and measurements of misfit dislocation density by diffraction methods in thin films on substrates
- Author
- JUNQUA, N; GRILHE, J
CNRS Univ. Poitiers, lab. métallurgie physique, 86022 Poitiers, France - Source
Thin solid films. 1994, Vol 250, Num 1-2, pp 37-41 ; ref : 12 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Contrainte Correction erreur Couche mince Couche épitaxique Densité dislocation Diffraction Dislocation interfaciale Défaut cristallin Déformation superficielle Epaisseur Epitaxie Etude expérimentale Propriété mécanique
- Keyword (en)
- Stresses Error correction Thin films Epitaxial layers Dislocation density Diffraction Misfit dislocations Crystal defects Surface deformation Thickness Epitaxy Experimental study Mechanical properties
- Keyword (es)
- Corrección error Densidad dislocación Deformación superficial
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B60 Condensed matter: structure, mechanical and thermal properties / 001B60H Surfaces and interfaces; thin films and whiskers (structure and nonelectronic properties) / 001B60H55 Thin film structure and morphology / 001B60H55J Structure and morphology; thickness
- Discipline
- Physics of condensed state : structure, mechanical and thermal properties
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3455237
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(94)90161-9 
https://dx.doi.org/10.1016/0040-6090(94)90161-9
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