Monostable-bistable transition logic elements (MOBILEs) based on monolithic integration of resonant tunneling diodes and FETs
- Author
- CHEN, K. J; AKEYOSHI, T; MAEZAWA, K
NTT LSI Laboratories, Atsugi-shi Kanagawa 243-01, Japan - Conference title
- Solid state devices and materials
- Conference name
- SSDM'94. International conference (Yokohama, Kanagawa 1994-08-23)
- Author (monograph)
- TARUCHA, SEIGO (Editor); ARAKAWA, YASUHIKO (Editor); SHIRAKI, YASUHIRO (Editor); SUSAKI, WATARU (Editor); YOSHIMI, MAKOTO (Editor); FUKUMA, MASAO (Editor); FURUYA, KAZUHITO (Editor); HORIKOSHI, YOSHIJI (Editor); IMAI, HAJIME (Editor); ISHIWARA, HIROSHI (Editor); KARAYAMA, YOSHIFUMI (Editor); MIYAO, MASANOBU (Editor); NAKASHIMA, HISAO (Editor)
Japan Society of Applied Physics, Tokyo, Japan (Funder/Sponsor) - Source
Japanese journal of applied physics. 1995, Vol 34, Num 2B, pp 1199-1203 ; 1 ; ref : 16 ref
- CODEN
- JJAPA5
- ISSN
- 0021-4922
- Scientific domain
- Crystallography; Optics; Condensed state physics; Physics; Plasma physics
- Publisher
- Japanese journal of applied physics, Tokyo
- Publication country
- Japan
- Document type
- Conference Paper
- Language
- English
- Keyword (fr)
- Analyse entrée sortie Caractéristique courant tension Circuit fonctionnel Circuit intégré monolithique Coupe transversale Diode Effet tunnel résonnant Energie potentielle Etude expérimentale Forme onde Porte logique Tension polarisation Tension électrique Transistor effet champ Transition monostable bistable
- Keyword (en)
- Input output analysis Voltage current curve Functional circuit Monolithic integrated circuit Cross section Diode Resonant tunnel effect Potential energy Experimental study Waveform Logic gate Bias voltage Voltage Field effect transistor
- Keyword (es)
- Análisis entrada salida Característica corriente tensión Circuito funcional Circuito integrado monolítico Corte transverso Diodo Efecto túnel resonante Energía potencial Estudio experimental Forma onda Puerta lógica Voltage polarización Voltaje Transistor efecto campo
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03F Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices / 001D03F06 Integrated circuits / 001D03F06A Design. Technologies. Operation analysis. Testing
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3475477
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1143/JJAP.34.1199 
https://dx.doi.org/10.1143/JJAP.34.1199
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