Oxidation behaviour of Cu-Ni(Mn) (constantan) films
- Author
- BRÜCKNER, W1 ; BAUNACK, S1 ; REISS, G1 ; LEITNER, G; KNUTH, T
[1] Inst. solid state materials res., 01171 Dresden, Germany - Source
Thin solid films. 1995, Vol 258, Num 1-2, pp 252-259 ; ref : 21 ref
- CODEN
- THSFAP
- ISSN
- 0040-6090
- Scientific domain
- Crystallography; Electronics; Metallurgy, welding; Condensed state physics
- Publisher
- Elsevier Science, Lausanne
- Publication country
- Switzerland
- Document type
- Article
- Language
- English
- Keyword (fr)
- Couche mince Cuivre Etude comparative Manganèse Mesure électrique Nickel Oxydation Profil profondeur Spectrométrie Auger TGA Traitement thermique Traitement thermochimique
- Keyword (en)
- Thin films Copper Comparative study Manganese Electrical measurement Nickel Oxidation Depth profiles AES TGA Heat treatments Thermochemical treatment
- Keyword (es)
- Estudio comparativo Medida eléctrica Tratamiento termoquímico
- Classification
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B80 Cross-disciplinary physics: materials science; rheology / 001B80A Materials science / 001B80A65 Surface treatments
- Discipline
- Physics and materials science
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3486471
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1016/0040-6090(94)06358-3 
https://dx.doi.org/10.1016/0040-6090(94)06358-3
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