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Modulated photothermal reflectance on porous silicon

Author
AMATO, G; BOARINO, L; BENEDETTO, G; SPAGNOLO, R
Ist. elettrotec. nazionale Galileo Ferraris, 10135 Torino, Italy
Conference title
Porous silicon and related materials
Conference name
European Materials Research Society Spr ing Conference. Symposium F (Strasbourg 1994-05-24)
Author (monograph)
HERINO, ROLAND (Editor)1 ; LANG, WALTER (Editor)
European Materials Research Society, Europe (Funder/Sponsor)
[1] Univ. J. Fourier Grenoble ; lab. spectrométrie physique, 38402 Saint Martin d'Hères, France
Source

Thin solid films. 1995, Vol 255, Num 1-2, pp 111-114 ; ref : 5 ref

CODEN
THSFAP
ISSN
0040-6090
Scientific domain
Crystallography; Electronics; Metallurgy, welding; Condensed state physics
Publisher
Elsevier Science, Lausanne
Publication country
Switzerland
Document type
Conference Paper
Language
English
Keyword (fr)
Coefficient réflexion Couche mince Effet fréquence Etude expérimentale Irradiation laser Luminescence Matériau poreux Photoluminescence Porosité Propriété optique Silicium
Keyword (en)
Reflectance Thin films Frequency effect Experimental study Laser irradiation Luminescence Porous materials Photoluminescence Porosity Optical properties Silicon
Keyword (es)
Coeficiente reflexión Efecto frecuencia Irradiación láser
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70H Optical properties and condensed-matter spectroscopy and other interactions of matter with particles and radiation / 001B70H66 Optical properties of specific thin films / 001B70H66D Elemental semiconductors and insulators

Pacs
7866D Elemental semiconductors and insulators

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3487089

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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