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Location on plural defects in conductive plates via neural networks

Author
MORABITO, F. C; CAMPOLO, M
Univ. Reggio Calabria, dip. ing. elettronica matematica applicata, 89127 Reggio Calabria, Italy
Conference title
CEFC'94 : biennial IEEE conference on electromagnetic field computation
Conference name
CEFC'94 : biennial IEEE conference on electromagnetic field computation (6 ; Grenoble 1994-07-05)
Author (monograph)
IEEE Magnetics Society ; Groupe Dauphiné-Savoies, France (Funder/Sponsor)
Société des électriciens et électroniciens, Paris, France (Funder/Sponsor)
Source

IEEE transactions on magnetics. 1995, Vol 31, Num 3, pp 1765-1768 ; 1 ; ref : 14 ref

CODEN
IEMGAQ
ISSN
0018-9464
Scientific domain
Electronics; Metallurgy, welding; Condensed state physics
Publisher
Institute of Electrical and Electronics Engineers, New York, NY
Publication country
United States
Document type
Conference Paper
Language
English
Keyword (fr)
Conducteur électrique Détection défaut Electrostatique Essai non destructif Localisation Plaque Problème inverse Réseau neuronal
Classification
Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D05 Electrical engineering. Electrical power engineering / 001D05B Testing. Reliability. Quality control

Pascal
001 Exact sciences and technology / 001D Applied sciences / 001D11 Metals. Metallurgy / 001D11H Analysing. Testing. Standards / 001D11H02 Nondestructive testing / 001D11H02A Testing for defects

Discipline
Electrical engineering. Electroenergetics Metals. Metallurgy
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3545653

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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