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Layered models and tunneling in HTSC

Author
SHUKRINOV, YU. M; NASRULLOEV, KH; MIRZOAMINOV, KH; SARHADOV, I
Physical technical inst., Dushanbe 734063, Tajikistan
Conference title
Conference on superconductivity and applications
Conference name
Conference on superconductivity and applications (7 ; Buffalo NY 1994-09-07)
Author (monograph)
NAUGHTON, M. J (Editor)1
New York State Institute om Superconductivity, Buffalo NY, United States (Funder/Sponsor)
[1] State univ. New York, Buffalo NY 14260, United States
Source

Applied superconductivity. 1994, Vol 2, Num 10-12, pp 741-745 ; ref : 7 ref

ISSN
0964-1807
Scientific domain
Electronics; Condensed state physics
Publisher
Elsevier Science, Oxford
Publication country
United Kingdom
Document type
Conference Paper
Language
English
Keyword (fr)
Caractéristique courant tension Effet tunnel Etude théorique Modèle couche Structure SIS Supraconducteur haute température Structure NIS
Keyword (en)
IV characteristic Tunnel effect Theoretical study Shell models SIS structure High-Tc superconductors
Keyword (es)
Estructura SIS
Classification
Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70D Superconductivity / 001B70D50 Proximity effects, weak links, tunneling phenomena, and josephson effects, adreev effect, sn and sns junctions

Pascal
001 Exact sciences and technology / 001B Physics / 001B70 Condensed matter: electronic structure, electrical, magnetic, and optical properties / 001B70D Superconductivity / 001B70D78 Superconducting films and low-dimensional structures / 001B70D78F Multilayers, superlattices , heterostructures

Pacs
7450 Proximity effects, weak links, tunneling phenomena, and Josephson effects

Discipline
Physics of condensed state : electronic structure, electrical, magnetic and optical properties
Origin
Inist-CNRS
Database
PASCAL
INIST identifier
3565223

Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS

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