Moyens de tests radiatifs pour la physique des hautes énergies
- Otro titulo
- Radiation facilities for high energy physics (en)
- Autor
- HABRARD, M.-C
Cent. physique particules Marseille, 13288 Marseille, France - Titulo de la publicación
- Méthodes de durcissement des composants et dispositifs électroniques
- Autor ( monografía)
- GIRARD, JACQUES (Author of introductory parts)1
[1] Société électriciens électroniciens ; club 21 composants électroniques, Paris, France - Fuente
Onde électrique. 1995, Vol 75, Num 3, pp 49-52 ; ref : 10 ref
- CODEN
- ONELAS
- ISSN
- 0030-2430
- Campo Científico
- Electronics; Telecommunications
- Editor
- Masson, Paris
- País de la publicación
- France
- Tipo de documento
- Article
- Idioma
- French
- Palabra clave (fr)
- Accélérateur Composant électronique Durcissement irradiation Dégât Détecteur Essai Irradiation Particule Pion Simulation Source neutron 2920 2940 Collisionneur LHC Source proton
- Palabra clave (in)
- Accelerators Electronic component Radiation hardening Damage Detectors Testing Irradiation Particles Pions Simulation Neutron sources LHC collider
- Palabra clave (es)
- Componente electrónico Estrago
- Clasificación
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B20 Nuclear physics / 001B20I Experimental methods and instrumentation for elementary-particle and nuclear physics / 001B20I20 Cyclic accelerators and storage rings
- Pascal
- 001 Exact sciences and technology / 001B Physics / 001B20 Nuclear physics / 001B20I Experimental methods and instrumentation for elementary-particle and nuclear physics / 001B20I40 Radiation detectors, dosimeters
- Disciplina
- Nuclear physics
- Procedencia
- Inist-CNRS
- Base de datos
- PASCAL
- Identificador INIST
- 3577036
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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"O:13:\"PanistOpenUrl\":36:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000idc\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Onde \u00e9lectrique\";s:9:\"\u0000*\u0000stitle\";s:12:\"Onde \u00e9lectr\";s:7:\"\u0000*\u0000date\";s:4:\"1995\";s:9:\"\u0000*\u0000volume\";s:2:\"75\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:2:\"49\";s:8:\"\u0000*\u0000epage\";s:2:\"52\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0030-2430\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"HABRARD\";s:10:\"\u0000*\u0000aufirst\";s:4:\"M.-C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ONELAS\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:70:\"M\u00e9thodes de durcissement des composants et dispositifs \u00e9lectroniques\";s:8:\"\u0000*\u0000title\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:6:\"Masson\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Acceso mediante Panist
"O:12:\"IstexOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Onde \u00e9lectrique\";s:9:\"\u0000*\u0000stitle\";s:12:\"Onde \u00e9lectr\";s:7:\"\u0000*\u0000date\";s:4:\"1995\";s:9:\"\u0000*\u0000volume\";s:2:\"75\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:2:\"49\";s:8:\"\u0000*\u0000epage\";s:2:\"52\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0030-2430\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"HABRARD\";s:10:\"\u0000*\u0000aufirst\";s:4:\"M.-C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ONELAS\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:70:\"M\u00e9thodes de durcissement des composants et dispositifs \u00e9lectroniques\";s:8:\"\u0000*\u0000title\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:6:\"Masson\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Acceso mediante Istex
"O:16:\"EuropePMCOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Onde \u00e9lectrique\";s:9:\"\u0000*\u0000stitle\";s:12:\"Onde \u00e9lectr\";s:7:\"\u0000*\u0000date\";s:4:\"1995\";s:9:\"\u0000*\u0000volume\";s:2:\"75\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:2:\"49\";s:8:\"\u0000*\u0000epage\";s:2:\"52\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0030-2430\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"HABRARD\";s:10:\"\u0000*\u0000aufirst\";s:4:\"M.-C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ONELAS\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:70:\"M\u00e9thodes de durcissement des composants et dispositifs \u00e9lectroniques\";s:8:\"\u0000*\u0000title\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:6:\"Masson\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Acceso mediante Europe PubMed Central
"O:11:\"BaseOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Onde \u00e9lectrique\";s:9:\"\u0000*\u0000stitle\";s:12:\"Onde \u00e9lectr\";s:7:\"\u0000*\u0000date\";s:4:\"1995\";s:9:\"\u0000*\u0000volume\";s:2:\"75\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:2:\"49\";s:8:\"\u0000*\u0000epage\";s:2:\"52\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0030-2430\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"HABRARD\";s:10:\"\u0000*\u0000aufirst\";s:4:\"M.-C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ONELAS\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:70:\"M\u00e9thodes de durcissement des composants et dispositifs \u00e9lectroniques\";s:8:\"\u0000*\u0000title\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:6:\"Masson\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Acceso mediante Base Search
"O:12:\"ArXivOpenUrl\":35:{s:10:\"\u0000*\u0000openUrl\";N;s:6:\"\u0000*\u0000fmt\";s:7:\"journal\";s:6:\"\u0000*\u0000doi\";s:0:\"\";s:6:\"\u0000*\u0000pii\";s:0:\"\";s:7:\"\u0000*\u0000pmid\";s:0:\"\";s:9:\"\u0000*\u0000atitle\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:9:\"\u0000*\u0000jtitle\";s:16:\"Onde \u00e9lectrique\";s:9:\"\u0000*\u0000stitle\";s:12:\"Onde \u00e9lectr\";s:7:\"\u0000*\u0000date\";s:4:\"1995\";s:9:\"\u0000*\u0000volume\";s:2:\"75\";s:8:\"\u0000*\u0000issue\";s:1:\"3\";s:8:\"\u0000*\u0000spage\";s:2:\"49\";s:8:\"\u0000*\u0000epage\";s:2:\"52\";s:8:\"\u0000*\u0000pages\";s:0:\"\";s:7:\"\u0000*\u0000issn\";s:9:\"0030-2430\";s:8:\"\u0000*\u0000eissn\";s:0:\"\";s:9:\"\u0000*\u0000aulast\";s:7:\"HABRARD\";s:10:\"\u0000*\u0000aufirst\";s:4:\"M.-C\";s:9:\"\u0000*\u0000auinit\";s:0:\"\";s:10:\"\u0000*\u0000auinitm\";s:0:\"\";s:5:\"\u0000*\u0000au\";a:0:{}s:9:\"\u0000*\u0000aucorp\";s:0:\"\";s:7:\"\u0000*\u0000isbn\";s:0:\"\";s:8:\"\u0000*\u0000coden\";s:6:\"ONELAS\";s:8:\"\u0000*\u0000genre\";s:7:\"article\";s:7:\"\u0000*\u0000part\";s:0:\"\";s:9:\"\u0000*\u0000btitle\";s:70:\"M\u00e9thodes de durcissement des composants et dispositifs \u00e9lectroniques\";s:8:\"\u0000*\u0000title\";s:63:\"Moyens de tests radiatifs pour la physique des hautes \u00e9nergies\";s:8:\"\u0000*\u0000place\";s:5:\"Paris\";s:6:\"\u0000*\u0000pub\";s:6:\"Masson\";s:10:\"\u0000*\u0000edition\";s:0:\"\";s:9:\"\u0000*\u0000tpages\";s:0:\"\";s:9:\"\u0000*\u0000series\";s:0:\"\";s:8:\"\u0000*\u0000proxy\";s:30:\"http:\/\/proxyout.inist.fr:8080\/\";s:12:\"\u0000*\u0000integrite\";b:1;}"
Acceso mediante arXiv
