Technology development of a high-density 32-channel 16-Gb/s optical data link for optical interconnection applications for the Optoelectronic Technology Consortium (OETC)
- Author
- YIU-MAN WONG1 ; MUEHLNER, D. J1 ; GUTH, G. D; FOCHT, M. W; GLOVOSKY, K. G; ZILKO, J. L; GATES, J. V1 ; ANTHONY, P. J1 ; TYRONE, B. H; IRELAND, T. J; LEWIS, D. H; SMITH, D. F; FAUDSKAR, C. C; NATI, S. F; LEWIS, D. K; ROGERS, D. L; AISPAIN, H. A; GOWDA, S. M; WALKER, S. G; KWARK, Y. H; BATES, R. J. S; KUCHTA, D. M; CROW, J. D; BUCHHOLZ, D. B; FISHTYEN, M1 ; BRANDNER, J. L; PARZYGNAT, W. J; MORGAN, R. A; MULLALLY, T1 ; LEIBENGUTH, R. E
[1] AT&T Bell Laboratories, Murray Hill NJ 07974, United States - Source
Journal of lightwave technology. 1995, Vol 13, Num 6, pp 995-1016 ; ref : 23 ref
- CODEN
- JLTEDG
- ISSN
- 0733-8724
- Scientific domain
- Electronics; Optics; Telecommunications
- Publisher
- Institute of Electrical and Electronics Engineers, New York, NY
- Publication country
- United States
- Document type
- Article
- Language
- English
- Keyword (fr)
- Architecture système Caractéristique optique Caractéristique temporelle Caractéristique électrique Chaînage donnée Circuit intégré Composé III-V Composé binaire Conception circuit Diagramme oeil Diaphonie Encapsulation Etude expérimentale Gallium Arséniure Interconnexion optique Laser cavité verticale Laser émission surface Photodétecteur Processus fabrication Structure MSM Transistor effet champ barrière Schottky As Ga GaAs Module multipuce Schéma bloc Taux erreur bit
- Keyword (en)
- System architecture Optical characteristic Time curve Electrical characteristic Data link Integrated circuits III-V compound Binary compound Circuit design Eye diagram Crosstalk Encapsulation Experimental study Gallium Arsenides Optical interconnects Vertical cavity laser Surface emitting laser Photodetectors Production process MSM structure MESFET devices Multichip module Function block diagram Bit error rate
- Keyword (es)
- Arquitectura sistema Característica óptica Característica temporal Característica eléctrica Ligazón datos Compuesto III-V Compuesto binario Concepción circuito Diagrama ojo Estudio experimental Arseniuro Laser cavidad vertical Laser emisión superficie Proceso fabricación Estructura MSM
- Classification
- Pascal
- 001 Exact sciences and technology / 001D Applied sciences / 001D03 Electronics / 001D03G Electric, optical and optoelectronic circuits / 001D03G02 Circuit properties / 001D03G02C Optical and optoelectronic circuits / 001D03G02C4 Miscellaneous
- Discipline
- Electronics
- Origin
- Inist-CNRS
- Database
- PASCAL
- INIST identifier
- 3597522
Sauf mention contraire ci-dessus, le contenu de cette notice bibliographique peut être utilisé dans le cadre d’une licence CC BY 4.0 Inist-CNRS / Unless otherwise stated above, the content of this bibliographic record may be used under a CC BY 4.0 licence by Inist-CNRS / A menos que se haya señalado antes, el contenido de este registro bibliográfico puede ser utilizado al amparo de una licencia CC BY 4.0 Inist-CNRS
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DOI
10.1109/50.390217 
https://dx.doi.org/10.1109/50.390217
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arXiv access
